Resolution Enhancement in IDDQ Testing for Large ICs
نویسندگان
چکیده
منابع مشابه
Feasibility of IDDQ Tests for Shorts in Deep Submicron ICs
Quiescent supply current(IDDQ) in deep submicron ICs is derived by circuit simulation and feasibility of IDDQ tests is examined for short defects in ICs fabricated with 0.18μm CMOS process. The results show that IDDQ of each gate depends on input logic values and that shorts can be detected by IDDQ testing if some process variations are small.
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ژورنال
عنوان ژورنال: VLSI Design
سال: 1994
ISSN: 1065-514X,1563-5171
DOI: 10.1155/1994/27973